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Monthly Archives: August 2017

Minimize noise from power supplies when making low-level measurements

Written on August 1, 2017 at 7:22 am, by

Low-level measurements are susceptible to noise from a number of different sources. While discussing all the ways that noise can degrade low-level measurements is outside the scope of this article, let’s at least consider how to make sure that your test system power supply is not a problem: Start with a low-noise power supply. The […]

How do electronic loads work?

Written on August 1, 2017 at 7:20 am, by

Electronic loads are used in a variety of tests, including power supply tests and battery tests. You can program them to provide exactly the kind of load that you need for the device you are testing. One of the most common ways to use an electronic load is in the constant current (CC) mode. In […]